Photoresist composition for imaging thick films

Radiation imagery chemistry: process – composition – or product th – Diazo reproduction – process – composition – or product – Composition or product which contains radiation sensitive...

Reexamination Certificate

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C430S192000, C430S193000, C430S270100, C430S326000

Reexamination Certificate

active

06852465

ABSTRACT:
The present invention relates to a light-sensitive photoresist composition especially useful for imaging thick films, comprising a film-forming alkali-soluble resin, a photoactive compound, and a surfactant at a level ranging from about 2000 ppm to about 14,000 ppm by weight of total photoresist. Preferably the photoresist film has a thickness greater than 20 microns. The invention further provides for a process for coating and imaging the light-sensitive composition of this invention.

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Japanese Abstract, JP95021626-B2, “Resist Composion for LSI Production—Consists of Alkali-soluble Resin, Organic Solvent, Fluoro:chemical Surfactant and Radiation Sensitive Substance”.
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Copy of International Search Report for PCT/EP2004/022391.

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