Photon scanning tunneling microscopy

Details Photon scanning tunneling microscopy Photon scanning tunneling microscopy

1988-10-21

1991-05-28

Rosenberger, Richard A.

Optics: measuring and testing

By polarized light examination

With light attenuation

350319, 356317, 25022711, G01B 1124

Patent

active

050188658

ABSTRACT:
A method and apparatus for photon scanning tunneling microscopy for examining a sample in a sample area on a surface at a subwavelength resolution is disclosed. The method comprises generating a near-field of photons at a surface containing a sample area. The near-field has an area that is larger than the sample area, and the near-field has an exponentially increasing intensity in a direction perpendicular to and towards the surface. The near-field is sampled with a probe which receives photons from that near-field that tunnel from the surface to the probe. The received photons are detected and a detector produces an output signal that is proportional to the number of photons received by the probe. The sample area is scanned with the probe in at least one direction parallel to the surface. While scanning, the probe may be maintained either at a position of a constant near-field intensity or at a position of constant distance from the surface. A photon scanning tunneling microscope for using the method is also disclosed.

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