Photon assisted sub-tunneling electrical probe, probe tip, and p

Details Photon assisted sub-tunneling electrical probe, probe tip, and p Photon assisted sub-tunneling electrical probe, probe tip, and p

1996-02-06

1998-06-23

Nguyen, Vinh P.

Electricity: measuring and testing

Fault detecting in electric circuits and of electric components

Of individual circuit component or element

324 96, G01R 31302

Patent

active

057709467

ABSTRACT:
An improved non-contact electrical measurement system, method, probe assembly, and probe. A probe having a photoemissive coating deposited thereon is provided and disposed substantially adjacent a measurement site of a test sample. The photoemissive coating of the probe is illuminated by a light source, and electrical measurements are made upon the photoemissive coating to determine the electrical characteristics of the measurement site.

REFERENCES:
patent: 4918309 (1990-04-01), Beha et al.
patent: 5177351 (1993-01-01), Lagowski
patent: 5500587 (1996-03-01), Takahashi et al.
patent: 5559330 (1996-09-01), Murashita

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