Photometer microscope for microphotometer scanning of fine speci

Details Photometer microscope for microphotometer scanning of fine speci Photometer microscope for microphotometer scanning of fine speci

1978-07-03

1980-08-19

Henry, Jon W.

Radiant energy

Ionic separation or analysis

Static field-type ion path-bending selecting means

350285, 350247, 250234, G02B 2100

Patent

active

042181127

ABSTRACT:
A positive and negative lens of equal power can provide the means to scan small objects being observed through a microscope if one of the lenses can be selectively decentered. The arrangement is particularly useful for microscopes having photometers that are used to analyze very small specimens, such as chromosomes, by scanning.

REFERENCES:
patent: 3254227 (1966-05-01), Hock
patent: 3780298 (1973-12-01), Agadzhanian et al.

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