Photometer for measuring atomic fluorescence

Details Photometer for measuring atomic fluorescence Photometer for measuring atomic fluorescence

1983-04-04

1985-08-06

Evans, F. L.

Optics: measuring and testing

By dispersed light spectroscopy

With sample excitation

2504581, G01N 2164

Patent

active

045332460

ABSTRACT:
In a photometer for measuring atomic fluorescence, a partial light beam is branched off the exciting light beam by means of a mirror having a hole. The partial light beam falls on a scattering disc, from which a reference light beam impinges upon the detector through opposite windows of the measuring cell. A chopper alternately transmits the exciting light beam and the partial light beam. The signal thus obtained at the detector permits compensation of the influence of variations of the light source brightness and of contamination of the windows.

REFERENCES:
patent: 2494440 (1950-01-01), Haynes
patent: 3297873 (1967-01-01), Hovnanian et al.
patent: 3520614 (1970-07-01), Goldstein
patent: 3811777 (1974-05-01), Chance
patent: 3822941 (1974-07-01), Roche et al.
patent: 3920334 (1975-11-01), Steichen et al.
patent: 4099872 (1978-07-01), White
"Spectrum Analyzer," R. W. Kern, IBM Technical Disclosure Bulletin, vol. 18, No. 9, Feb. 1976, p. 2845.

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