Optics: measuring and testing – Photometers – Integrating
Patent
1972-08-07
1976-04-20
Wibert, Ronald L.
Optics: measuring and testing
Photometers
Integrating
250211J, G01j 146
Patent
active
039515524
ABSTRACT:
A long exposure photometer-digitizer operative in an integration mode to receive weak illumination as from celestial observations through a telescope or from field or laboratory observations of objects and to provide a recorded digital representation thereof. A silicon, vidicon illumination sensor is employed to provide a wide dynamic range, sensitive and linear response over a large spectral region. Cumulative photon interaction with the vidicon tube during a long exposure is achieved by operating the vidicon at a reduced temperature which minimizes dark current effects and promotes integration mode operation. After a predetermined vidicon exposure interval the image electrically stored in the target is read out by a scanning electron beam, digitized and recorded to provide an immediately available digital record of the object. The target is sensitized before each exposure.
REFERENCES:
patent: 3011089 (1961-11-01), Reynolds
patent: 3021433 (1962-02-01), Morrison
patent: 3227885 (1966-01-01), Hirai et al.
patent: 3403284 (1968-09-01), Buck et al.
patent: 3407322 (1968-10-01), Saum
patent: 3617626 (1971-11-01), Bluth et al.
patent: 3634692 (1972-01-01), Padovani
McCord Thomas B.
Westphal James A.
Clark Conrad
Gagnebin , III Charles L.
Massachusetts Institute of Technology
Shaw Robert
Smith, Jr. Arthur A.
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