Optics: measuring and testing – Inspection of flaws or impurities – Bore inspection
Patent
1975-04-21
1976-11-16
Corbin, John A.
Optics: measuring and testing
Inspection of flaws or impurities
Bore inspection
356223, G01N 2122
Patent
active
039921131
ABSTRACT:
Photometer circuitry includes a capacitor discharge means for establishing a time period related to the light absorption properties of a test sample. The time period is used, in conjunction with a frequency generator to drive a digital counter to provide a digital indication of light absorption.
REFERENCES:
patent: 3528749 (1970-09-01), Bowker
patent: 3664744 (1972-05-01), Liston
patent: 3843265 (1974-10-01), Egli
Egli Bruno
Niklaus Manser
Clark Conrad
Corbin John A.
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