Photomasks

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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07604905

ABSTRACT:
Photomasks are disclosed. A disclosed example photomask comprises: a first pattern located along an axis of the photomask; at least one second pattern located a distance from and a predetermined angle to the first pattern; and slits made of Cr on at least one end of each of the first and second patterns, wherein the photomask is a Cr-less mask.

REFERENCES:
patent: 5858580 (1999-01-01), Wang et al.
patent: 5989756 (1999-11-01), Nakae
patent: 6406818 (2002-06-01), Zemen et al.
patent: 6828068 (2004-12-01), Progler et al.
patent: 10-2002-0090487 (2002-12-01), None
patent: WO 03/054626 (2003-07-01), None

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