Photomask substrate made of synthetic quartz glass and...

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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07491475

ABSTRACT:
It is to provide a photomask substrate which has a low birefringence and with which polarized illumination can be employed or immersion exposure can be carried out.A photomask substrate made of a synthetic quartz glass to be used for production of a semiconductor employing a light source having an exposure wavelength of at most about 200 nm, which has a birefringence of at most 1 nm/6.35 mm at the exposure wavelength, and of which the amount of decrease in light transmittance is at most 1.0% as a difference in light transmittance at a wavelength of 217 nm, between before and after irradiation with Xe excimer lamp with an illuminance of 13.2 mW/cm2for 20 minutes.

REFERENCES:
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patent: 6319634 (2001-11-01), Berkey et al.
patent: 6333284 (2001-12-01), Otsuka et al.
patent: 1 067 096 (2001-01-01), None
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patent: 2001-302275 (2001-10-01), None
patent: 2003-515192 (2003-04-01), None
patent: 02/069054 (2002-09-01), None
U.S. Appl. No. 11/836,304, filed Aug. 9, 2007, Kikugawa et al.

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