Optics: measuring and testing – Inspection of flaws or impurities – Transparent or translucent material
Patent
1994-08-19
1996-08-20
McGraw, Vincent P.
Optics: measuring and testing
Inspection of flaws or impurities
Transparent or translucent material
356364, 356370, G01N 2188, G01J 400, G01J 404
Patent
active
055484018
ABSTRACT:
In a photomask inspecting method, a photomask is inspected on the basis of the difference between the polarized state of elliptical light produced upon superposition of two linearly polarized light beams having orthogonal polarization directions and passing through two different optical paths and the polarized state of elliptical light produced when two linearly polarized light beams are superposed on each other after a target portion of a photomask is set in the optical path of one of the linearly polarized light beams. A photomask inspecting apparatus is also disclosed.
REFERENCES:
patent: 5037202 (1991-08-01), Batchelder et al.
Matsuura et al "Measurement of optical phase difference using a polarization technique" Optics and Laser Technology; Dec. 1977, vol. 9, No. 6; pp. 285-289.
A. P. Ghosh and D. B. Dove, "Direct Phase Measurements In Phase Shift Masks", SPIE vol. 1673 Integrated Circuit Metrology, Inspection, and Process Control VI(1991), pp. 242-254.
Stanley S. C. Chim and Gordon S. Kino, "Phase measurements using the Mirau correlation microscope", 1 Jun. 1991/vol. 30, No. 16/Applied Optics, pp. 2197-2201.
Wolfgang Budde, "Photoelectric Analysis of Polarized Light", May 1962/vol. 1, No. 3/Applied Optics, pp. 201-205.
Emi Tamechika et al., "Investigation of Single Sideband Optical Lithography (SSBL) Using Oblique Incidence Illumination", EIPB '92 Orlando, The 36th International Symposium on Electron, Ion and Photon Beams, May 26th-29th, 1992, total 3(three) pages.
Takahiro Ode, "Improvement of Phase Measurements in Phase-Shift Masks With a Differential Heterodyne Interferometer", PhotoMask Japan, Digest of Papers Photomask Japan '94, Symposium on Photomask and X-Ray Mask Technology, 22 Apr. 1994, Kanagawa Science Park Kanagawa, Japan, total 3 (three) pages.
McGraw Vincent P.
Nippon Telegraph and Telephone Public Corporation
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