Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Reexamination Certificate
2005-08-10
2009-11-17
Rosasco, Stephen (Department: 1795)
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
Reexamination Certificate
active
07618753
ABSTRACT:
A metal film is provided as a light shielding layer on one principle surface of a photomask substrate. The metal film cannot be substantially etched by chlorine-based dry etching containing oxygen ((Cl+O)-based dry etching) and can be etched by chlorine-based dry etching not containing oxygen (Cl-based dry etching) and fluorine-based dry etching (F-based dry etching). On the light shielding layer, a metal compound film as an antireflective layer. The metal compound film cannot be substantially etched by chlorine-based dry etching not containing oxygen (Cl based) and can be etched by at least one of chlorine-based dry etching containing oxygen ((Cl+O) based) and fluorine-based dry etching (F based).
REFERENCES:
patent: 4717625 (1988-01-01), Watakabe et al.
patent: 4783371 (1988-11-01), Watakabe et al.
patent: 4792461 (1988-12-01), Watakabe et al.
patent: 5750290 (1998-05-01), Yasuzato et al.
patent: 6008135 (1999-12-01), Oh et al.
patent: 6514642 (2003-02-01), Okazaki et al.
patent: 6599667 (2003-07-01), Yusa et al.
patent: 7115341 (2006-10-01), Shiota et al.
patent: 2002/0039689 (2002-04-01), Yusa et al.
patent: 2003/0003756 (2003-01-01), Yu
patent: 2005/0238963 (2005-10-01), Ishibashi et al.
patent: 2006/0057469 (2006-03-01), Kureishi et al.
patent: 213693 (1991-08-01), None
patent: 1152292 (2004-08-01), None
patent: 59-139033 (1984-08-01), None
patent: 59-139034 (1984-08-01), None
patent: 62-044740 (1987-02-01), None
patent: 62-052551 (1987-03-01), None
patent: 63-085553 (1988-04-01), None
patent: 04-075059 (1992-03-01), None
patent: 11-242323 (1999-09-01), None
patent: 2001-312043 (2001-11-01), None
patent: 3093632 (2003-02-01), None
patent: 2003-195479 (2003-07-01), None
patent: 2003-195483 (2003-07-01), None
patent: 2004-039884 (2004-02-01), None
patent: 509819 (2002-11-01), None
patent: 200413838 (2004-08-01), None
patent: WO 03/046659 (2003-06-01), None
patent: WO 2004-006018 (2004-01-01), None
patent: WO 2004-070472 (2004-08-01), None
Communication from European Patent Office regarding Application No. 5 770 691.3 dated Aug. 19, 2009 citing US 6,008,135, 4 pages.
Fukushima Yuichi
Haraguchi Takashi
Inazuki Yukio
Iwakata Masahide
Kinase Yoshinori
Finnegan Henderson Farabow Garrett & Dunner LLP
Rosasco Stephen
Shin-Etsu Chemical Co. , Ltd.
Toppan Printing Co. Ltd.
LandOfFree
Photomask blank, photomask and method for producing those does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Photomask blank, photomask and method for producing those, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Photomask blank, photomask and method for producing those will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-4128849