Photomask blank manufacturing method

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

Reexamination Certificate

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Reexamination Certificate

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07026077

ABSTRACT:
A method of manufacturing a photomask blank having at least a film for forming a mask pattern on a transparent substrate comprises the steps of causing a sputtering atmosphere to contain at least a helium gas to form a film for forming the mask pattern by sputtering, and heating the transparent substrate during or after the film forming step.

REFERENCES:
patent: 5538816 (1996-07-01), Hashimoto et al.
patent: 6677087 (2004-01-01), Nozawa et al.
patent: 6723477 (2004-04-01), Nozawa et al.
patent: 6-214792 (1994-08-01), None
patent: 2878143 (1999-01-01), None
patent: 2989156 (1999-10-01), None
patent: 2001-246080 (2001-09-01), None
patent: 2001-75069 (2001-08-01), None
patent: WO 0106318 (2001-01-01), None
Monthly Semiconductor World 1990. 12, Applied Physics vol. 60, Nov. (1991).

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