Photomask blank and photomask

Stock material or miscellaneous articles – All metal or with adjacent metals – Composite; i.e. – plural – adjacent – spatially distinct metal...

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Details

428664, 428666, 428667, 428632, 428633, B32B 900, H01L 21302

Patent

active

045566089

ABSTRACT:
A photomask is fabricated by forming, in a photomask (hard mask) produced by forming a patternized film of a masking material comprising (a) a layer of metallic chromium and (b) a layer of chromium oxides superposed thereon, a film of a translucent and electroconductive material selected from Nb, Ta and V, between the masking film and the transparent substrate. At the time of pattern transferring by photolithography, dropping off of parts of the pattern of this photomask does not occur even when it includes isolated island-like parts, and, at the time of inspection by electron-beam exposure, the precision of inspection does not lower. This photomask is obtained by patternizing by selective etching the masking film of a photomask blank produced by successively forming, on the transparent substrate, the translucent and electroconductive film and the masking film.

REFERENCES:
patent: 3443915 (1969-05-01), Wood et al.
patent: 4342817 (1982-08-01), Bohlen et al.
patent: 4374912 (1983-02-01), Kaneki et al.

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