Photomask and method of manufacturing the same

Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask

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430311, 430320, G03F 900

Patent

active

054222060

ABSTRACT:
A first anti-reflection film is inserted between a transparent glass substrate and the light shielding pattern. The first anti-reflection film has a refractive index larger than that of the glass substrate but smaller than that of the light shielding pattern. A second anti-reflection film is formed on the glass substrate between adjacent light shielding patterns. The second anti-reflection film has a refractive index larger than that of air but smaller than that of the glass substrate. Thus, a light beam entering the glass substrate is not reflected at the front surface of the glass substrate regardless of whether the light beam entered in a portion provided with a light shielding pattern.

REFERENCES:
patent: 4178403 (1979-12-01), Sakurai et al.
patent: 4411972 (1983-10-01), Narken et al.
patent: 4720442 (1988-01-01), Shinkai et al.

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