Radiation imagery chemistry: process – composition – or product th – Registration or layout process other than color proofing
Reexamination Certificate
2006-12-19
2006-12-19
Young, Christopher G. (Department: 1756)
Radiation imagery chemistry: process, composition, or product th
Registration or layout process other than color proofing
C430S312000
Reexamination Certificate
active
07150948
ABSTRACT:
A photomask includes a main mask pattern having first chip patterns and having a first size corresponding to a maximum exposure area of a projection exposure apparatus. The mask further includes a sub-mask pattern having second chip patterns different from the first chip patterns, having a second size smaller than the first size, and arranged adjacently to the main mask pattern.
REFERENCES:
patent: 1-239555 (1989-09-01), None
patent: 2-127640 (1990-05-01), None
patent: 6-20911 (1994-01-01), None
patent: 9-134870 (1997-05-01), None
patent: 11-305418 (1999-11-01), None
Oki Electric Industry Co. Ltd.
Young Christopher G.
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