Compositions: ceramic – Ceramic compositions – Glass compositions – compositions containing glass other than...
Reexamination Certificate
2006-01-03
2006-01-03
Group, Karl (Department: 1755)
Compositions: ceramic
Ceramic compositions
Glass compositions, compositions containing glass other than...
Reexamination Certificate
active
06982232
ABSTRACT:
Lithographic methods are disclosed. In one such method, a pulsed ultraviolet radiation source for producing ultraviolet lithography radiation having a wavelength shorter than about 300 nm at a fluence of less than 10 mJ/cm2/pulse and a high purity fused silica lithography glass having a concentration of molecular hydrogen of between about 0.02×1018molecules/cm3and about 0.18×1018molecules/cm3are provided. A lithography pattern is formed with the ultraviolet lithography radiation; the lithography pattern is reduced to produce a reduced lithography pattern; and the reduced lithography pattern is projected onto a ultraviolet radiation sensitive lithography medium to form a printed lithography pattern. At least one of the forming, reducing, and projecting steps includes transmitting the ultraviolet lithography radiation through the high purity fused silica lithography glass. Lithography systems and high purity fused silica lithography glass are also described.
REFERENCES:
patent: 5086352 (1992-02-01), Yamagata et al.
patent: 5139606 (1992-08-01), Maki
patent: 5141786 (1992-08-01), Shimizu et al.
patent: 5325230 (1994-06-01), Yamagata et al.
patent: 5364433 (1994-11-01), Nishimura et al.
patent: 5410428 (1995-04-01), Yamagata et al.
patent: 5616159 (1997-04-01), Araujo et al.
patent: 5668067 (1997-09-01), Araujo et al.
patent: 5707908 (1998-01-01), Komine et al.
patent: 5735921 (1998-04-01), Araujo et al.
patent: 5880817 (1999-03-01), Hashimoto
patent: 5896222 (1999-04-01), Rosplock et al.
patent: 6031238 (2000-02-01), Fujinoki et al.
patent: 6058739 (2000-05-01), Morton et al.
patent: 6174830 (2001-01-01), Jinbo et al.
patent: 6181724 (2001-01-01), Tanaka et al.
patent: 6242136 (2001-06-01), Moore et al.
patent: 2001/0000508 (2001-04-01), Jinbo et al.
patent: 2001/0012099 (2001-08-01), Kumagai
patent: 0 779 558 (1997-06-01), None
Lemaire et al., “High Pressure H2 Loading as a Technique for Achieving Ultrahigh UV Photosensitivity and Thermal Sensitivity in GeO2 Doped Optical Fibers,”Electronics Letters, 29(13):1191-1193 (1993).
Allan et al., “193-nm Excimer-laser-induced Densification of Fused Silica,”Opt. Lett., 21(24):1960-1962 (1996).
Schenker et al., “Material Limitations to 193-nm Lithographic System Lifetimes”,Proc. SPIE, 2726:698-706 (1996).
Borrelli et al., “Densification of Fused Silica Under 193-nm Excitation,”J. Opt. Soc. Am. B, 14(7):1606-1615 (1997).
Collier et al., “Semiconductor Fabrication Drives Deep-UV Optic,”Laser World Focus, pp. 63-70 (Dec., 1998).
Borrelli et al., “Excimer-laser induced Densification in Binary Silica Glasses,”Opt. Lett., 24(20):1401-1403 (1999).
Liberman et al., “Excimer-laser-induced Densification of Fused Silica: Laser-fluence and Material-grade Effects on the Scaling Law,”J. Non-Cryst. Solids, 244:159-171 (1999).
Van Peski et al., “Behavior of Fused Silica Irradiated by Low Level 193 nm Excimer Laser for Tens of Billions of Pulses,”J. Non-Cryst. Solids, 265:285-289 (2000).
Smith et al., “Excimer Laser-induced Expansion in Hydrogen-loaded Silica,”Appl. Phys. Lett., 78(17): 2452-2454 (2001).
“HPFS® Standard Grade” Corning, New York: Corning Incorporated (1999).
“HPFS® ArF Grade” Corning, New York: Corning Incorporated (1999).
“HPFS® KrF Grade” Corning, New York: Corning Incorporated (1999).
Primak et al., “The Radiation Compaction of Vitreous Silica,”J. Appl. Phys., 39(12):5651-5658 (1968).
Hill et al., “Photosensitivity in Optical Fiber Waveguides: Application to Reflection Filter Fabrication,”Appl. Phys. Lett., 32(10):647-649 (1978).
Shelby, “Radiation Effects in Hydrogen-impregnated Vitreous Silica,”J. Appl. Phys., 50(5):3702-3706 (1979).
Rothschild et al., “Effects of Excimer Laser Irradiation on the Transmission, Index of Refraction, and Density of Ultraviolet Grade Fused Silica,”Appl. Phys. Lett., 55(13):1276-1278 (1989).
Borrelli Nicholas F.
Moll Johannes
Smith Charlene M.
Bolden Elizabeth A.
Chen Siwen
Corning Incorporated
Group Karl
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