Photoemitter

Electrical transmission or interconnection systems – Personnel safety or limit control features – Interlock

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357 4, 357 15, 357 30, 313542, H01J 134

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active

051381915

ABSTRACT:
A junction, such as a Schottky junction, is formed between a conductive electrode and a semiconductor. A bias voltage is applied between the conductive electrode and an outward-emission-side electrode formed on the semiconductor at the side opposite to the junction. Upon illumination, photoelectrons are internally emitted in the conductive electrode into the semiconductor, transported through the semiconductor, and emitted outward from the semiconductor surface, which has been so treated as to reduce the surface barrier height. The semiconductor is semi-insulating, or a p-n junction is formed therein.

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patent: 4694312 (1987-09-01), Yamazaki
patent: 4920387 (1990-04-01), Takasu et al.
C. A. Stolte et al. "The Schottky Barrier Cold Cathode" Solid-State Electronics, vol. 12, pp. 945-954, Great Britain Apr. 30, 1969.
R. L. Bell et al., "Transferred Electron Photoemission From InP", Applied Physics Letters, vol. 25, No. 11, Dec. 1, 1974, pp. 645-646.
W. E. Spicer, "Negative Affinity 3-5 Photocathodes: Their Physics and Technology", Applied Physics 12, 1977, pp. 115-130.
R. E. Simon et al., "Field Induced Photoemission and Hot-Electron Emission from Germanium", J. Appl. Phys., V. 31, 1960, pp. 1505-1506.
J. S. Escher et al., "Field-Assisted Semiconductor Photoemitters for the 1-2 .mu.m Range", IEEE Transactions on Electron Devices, vol. ED-27, No. 7, Jul. 1980, pp 1244-1249.
R. E. Simon et al., "Photoemission from Si Induced by an Internal Electric Field", Physical Review, vol. 119, No. 2, Jul. 15, 1960, pp. 621-622.

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