Photoelectric measuring system

Details Photoelectric measuring system Photoelectric measuring system

1987-10-19

1988-10-18

Rosenberger, R. A.

Optics: measuring and testing

By polarized light examination

With light attenuation

33125C, 250237G, G01B 1102, G01B 702

Patent

active

047782730

ABSTRACT:
In a photoelectric measuring arrangement two grids operating as a scale and a scanning plate are built up of several component phase grids which define periodic graduations having differing grid constants. The periodic signals of differing periodicity arising through diffraction are optically or electrically summed.

REFERENCES:
patent: 3816003 (1974-06-01), Litke
patent: 4176276 (1979-11-01), Kaul et al.
patent: 4340305 (1982-07-01), Smith et al.
patent: 4477189 (1984-10-01), Ernst
Dreigitterschrittgeber, Dissertation by Dipl-Ing. Jorg. Willhelm, given Jun. 23, 1941, (1978), pp. 12-26.

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