Optics: measuring and testing – By polarized light examination – With light attenuation
Patent
1981-02-20
1983-05-31
Rosenberger, R. A.
Optics: measuring and testing
By polarized light examination
With light attenuation
33125C, 250214C, G01B 1104
Patent
active
043858368
ABSTRACT:
An improved digital photoelectric position measuring device of the type comprising a scale, a scanning unit for generating scanning signals, and an evaluating circuit for evaluating the scanning signals, wherein the scanning unit includes at least one photoelectric circuit comprising a pair of photosensitive elements for generating counterphase scanning signals, and wherein the evaluating circuit includes at least one pulse forming circuit response to the difference of the counterphase scanning signals. The measuring device includes at least one photosensitive element for generating a direct flux signal and a light source for illuminating the photosensitive element. The direct flux signal is applied to at least one photoelectric circuit in order to balance the pair of photosensitive elements independently of the evaluating unit.
REFERENCES:
patent: 3713139 (1973-01-01), Sanford et al.
patent: 4263506 (1981-04-01), Epstein
messen+prufen/automatik, Jun. 1974, pp. 371-374, "Neuere Entwicklungen bei fotoelektrischen Langenmessgeraten".
Dr. Johannes Heidenhain GmbH
Rosenberger R. A.
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