Photoelastic effect measuring device

Details Photoelastic effect measuring device Photoelastic effect measuring device

1987-08-11

1989-03-07

Willis, Davis L.

Optics: measuring and testing

Material strain analysis

With polarized light

356332, 356365, 356367, G01L 124, G01N 2123

Patent

active

048100897

ABSTRACT:
A photoelastic effect measuring device comprising a single white light source, a prism dispersing light emitted by said white light source and a variable slit device, which selects an arbitrary spectrum of light thus dispersed is disclosed, in which for a photoelastic effect measurement using white light, the slit width is opened totally so that all the light spectrum pass therethrough so as to pass through a sample to be measured and for a photoelastic effect measurement using a specified monochromatic light beam, the slit width is controlled so as to have a predetermined opening so that only a specified light spectrum can pass therethrough so as to pass through a sample to be measured.

REFERENCES:
patent: 3462227 (1969-08-01), Tipotsch
patent: 4309110 (1982-01-01), Tumerman

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