Active solid-state devices (e.g. – transistors – solid-state diode – Responsive to non-electrical signal – Electromagnetic or particle radiation
Reexamination Certificate
2006-09-12
2006-09-12
Eckert, George (Department: 2813)
Active solid-state devices (e.g., transistors, solid-state diode
Responsive to non-electrical signal
Electromagnetic or particle radiation
C438S057000, C438S305000, C257S290000
Reexamination Certificate
active
07105906
ABSTRACT:
The loss of photogenerated electrons to surface electron-hole recombination sites is minimized by utilizing a first p-type surface region to form a depletion region that functions as a first barrier that repels photogenerated electrons from the surface recombination sites, and a second p-type surface region that provides a substantial change in the dopant concentration.
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Drury Robert
Hopper Peter J.
Mian Michael
Bryant Deloris
Eckert George
Pickering Mark C.
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