Optics: measuring and testing – Of light reflection
Patent
1997-01-09
1998-09-15
Rosenberger, Richard A.
Optics: measuring and testing
Of light reflection
369122, G11B 7125
Patent
active
058087460
ABSTRACT:
A semiconductor light amplifier device emits, from an exit end processed to yield no reflection, outgoing light with a light quantity corresponding to a driving signal input from a driving circuit. This outgoing light irradiates, by way of an optical system, an object to be measured; whereas the reflected light, scattered light, and diffracted light generated by the object trace back the optical system and are made incident on the exit end of the semiconductor light amplifier device in a feedback manner as return light. Accordingly, the light amplifier device performs optical amplification as the return light is incident thereon, thereby increasing the light quantity of the outgoing light. This change in light quantity of the outgoing light is detected by the light-receiving device and output therefrom as a light-receiving signal. Thus, as the relationship between the driving signal and light quantity of the outgoing light in the semiconductor light amplifier device changes in response to the light quantity of the return light, an optical characteristic of the object is measured. Therefore, a photodetector apparatus can be obtained, in which, as noise caused by the return light is suppressed, a high S/N ratio and a wide dynamic range are attained while a high-speed response is enabled.
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Koishi Musubu
Shirakawa Kouichi
Terada Hirotoshi
Yasukawa Manabu
Hamamatsu Photonics K.K.
Rosenberger Richard A.
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