Photochemical method for the separation of mixtures of xenon and

Chemistry: electrical and wave energy – Processes and products – Processes of treating materials by wave energy

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B01J 1912

Patent

active

045280800

ABSTRACT:
Xenon is isolated from a gaseous mixture containing xenon and krypton. Fline is added to the mixture and the resulting mixture then irradiated with light of about 250-370 nm to form crystals of xenon difluoride. The unreacted gases are removed and the remaining crystals are decomposed, typically by thermal means, to yield xenon and fluorine gas. The xenon gas may be easily isolated by conventional means from the fluorine gas. Krypton may also be easily isolated from the remaining gases by conventional means. The process is particularly applicable to the treatment of offgases from a nuclear reactor or reprocessing plant.

REFERENCES:
patent: 2705219 (1955-03-01), Heiskell et al.
patent: 3185548 (1965-05-01), Fields et al.
patent: 3377136 (1968-04-01), Morrow
patent: 4045316 (1977-08-01), Legan
patent: 4158614 (1979-06-01), Schuster et al.

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