Photo reticle for fabricating a semiconductor device

Photocopying – Contact printing – Frames

Patent

Rate now

  [ 0.00 ] – not rated yet Voters 0   Comments 0

Details

355 53, 430 5, G03B 2728, G03F 900

Patent

active

052509834

ABSTRACT:
An original layout pattern for reticle includes a tip pattern region, a scribe region formed around the tip pattern region, and alignment marks formed in the scribe region. Each end of the alignment marks is not reached to a edge of the original layout pattern. Therefore, when the original layout pattern is formed on the reticle side by side in predetermined times, the alignment marks positioned at an inner portion between two adjacent patterns are separated from each other.

REFERENCES:
patent: 4577958 (1986-03-01), Phillips
patent: 4597664 (1986-07-01), Johannsmeier et al.
patent: 4780615 (1988-10-01), Suzuki
patent: 4823012 (1989-04-01), Kosugi
patent: 4849313 (1989-07-01), Chapman et al.
patent: 4937618 (1990-06-01), Ayata et al.
patent: 4952815 (1990-08-01), Nishi
patent: 4962423 (1990-10-01), Yamada et al.
patent: 4980718 (1990-12-01), Salter et al.
patent: 5160957 (1992-11-01), Ina et al.

LandOfFree

Say what you really think

Search LandOfFree.com for the USA inventors and patents. Rate them and share your experience with other people.

Rating

Photo reticle for fabricating a semiconductor device does not yet have a rating. At this time, there are no reviews or comments for this patent.

If you have personal experience with Photo reticle for fabricating a semiconductor device, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Photo reticle for fabricating a semiconductor device will most certainly appreciate the feedback.

Rate now

     

Profile ID: LFUS-PAI-O-1008192

  Search
All data on this website is collected from public sources. Our data reflects the most accurate information available at the time of publication.