Electricity: measuring and testing – Magnetic – With means to create magnetic field to test material
Patent
1995-02-23
1998-03-03
Snow, Walter E.
Electricity: measuring and testing
Magnetic
With means to create magnetic field to test material
324226, G01R 3312, H01L 4308
Patent
active
057239789
ABSTRACT:
A magnetic device, comprises a first magnetic layer; a second magnetic layer on the magnetic layer and having a coercive force smaller than that of the first magnetic layer; a semiconductor layer between the first and second magnetic layers so that photo-induced magnetism occurs between the first and second magnetic layers when the semiconductor layer is irradiated with light, a third magnetic layer on the second magnetic layer, the third magnetic layer having a coercive force larger than the coercive force of the second magnetic layer, and a second semiconductor layer between the second and third magnetic layers, magnetism being induced between the second and third magnetic layers when the second semiconductor layer is irradiated with light.
REFERENCES:
patent: 4871614 (1989-10-01), Kobayashi
Inomata, et al., "Giant Magnetoresistance and Low Saturation Fields in Co-Fe/Cu Multilayers," Journal of Magnetism & Magnetic Materials, vol. 126 (1993).
"Light Induced Magnetic Exchange-Coupling", B. Briner et al., Z. Phys. B92, pp. 137-139, (1993).
"Photoinduced Antiferromagnetic Interlayer Coupling in Fe/(Fe-Si) Superlattices", J.E. Mattson et al., Physical Review Letters, 71 (1):185-188 (1993).
Highmore Roger
Inomata Koichiro
Takahashi Yoshinori
Yusu Keiichiro
Kabushiki Kaisha Toshiba
Snow Walter E.
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