Photo-electric particle sensing system

Details Photo-electric particle sensing system Photo-electric particle sensing system

1981-09-28

1983-12-27

Sikes, William L.

Optics: measuring and testing

By particle light scattering

With photocell detection

356246, 356342, G01N 2147

Patent

active

044227612

ABSTRACT:
A particle sensing system in which light is concentrated at an inspection zone and deflected light is concentrated at a photosensor. A first reflecting surface is shaped to direct light toward the inspection zone, and a second reflecting surface is shaped to direct light deflected by particles in the inspection zone toward the photosensor. These two reflecting surfaces can be shaped so that an overwhelming part of the directions around the inspection zone are utilized for illuminating it and to direct light deflected toward the photosensor. A third reflecting surface, having spherical curvature with the center of curvature at the inspection zone permits utilization of an overwhelming part of the remaining directions around the inspection zone.

REFERENCES:
patent: 3248551 (1966-04-01), Frommer
patent: 3457407 (1969-07-01), Goldberg
patent: 4022529 (1977-05-01), White
patent: 4088407 (1978-05-01), Schoeffel et al.
patent: 4188543 (1980-02-01), Brunsting et al.
patent: 4245910 (1981-01-01), Kallander
patent: 4311387 (1982-01-01), deMey et al.

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