Photo-detector filter

Optics: measuring and testing – Photometers

Reexamination Certificate

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Reexamination Certificate

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07053998

ABSTRACT:
Method and systems related to obstructing a first predefined portion of at least one defined wavelength of light incident upon a first photo-detector array; and detecting the at least one defined wavelength of light with a photo-detector in a second photo-detector array.

REFERENCES:
patent: 4238760 (1980-12-01), Carr
patent: H000101 (1986-08-01), Walker
patent: 4945242 (1990-07-01), Berger et al.
patent: 5216384 (1993-06-01), Vanhecke
patent: 5286990 (1994-02-01), Hynecek
patent: 5561287 (1996-10-01), Turner et al.
patent: 5854574 (1998-12-01), Singer et al.
patent: 5864146 (1999-01-01), Karellas
patent: 5965875 (1999-10-01), Merrill
patent: 6114910 (2000-09-01), Goff
patent: 6246345 (2001-06-01), Davidson et al.
patent: 6278142 (2001-08-01), Hynecek
patent: 6300612 (2001-10-01), Yu
patent: 6395576 (2002-05-01), Chang et al.
patent: 6501400 (2002-12-01), Ali
patent: 6632701 (2003-10-01), Merrill
patent: 2002/0003201 (2002-01-01), Yu
patent: 2002/0030544 (2002-03-01), Kulhalli et al.
patent: 2004/0119477 (2004-06-01), Kazemi-Nia
patent: 06319042 (1994-11-01), None
patent: 2003-163556 (2003-06-01), None
Black, Brian, Analog-to-Digital Converter Architectures and Choices for System Design, Analog Dialogue 33-8 (1999), pp. 1-4.
Denvir, Donal J., et al., Electron Multiplying CCDs, Andor Technology Ltd. UK at www.andor-tech.com; Printed on Feb. 26, 2004; pp. 1-14.
Andor Technology Website link: Andor-tech.com\low light imaging\ixon\EMCCD—“The iXon CCDs featuring EM technology are the most sensitive imaging detectors ever!” Printed on Feb. 26, 2004.
Foveon Brochure, copyright 2002 Foveon, Inc.—website: www.foveon.com.
Lyon, Richard F., Foveon X3 Slides from Chief Scientist Richard F. Lyon's talks regarding Color Photography with Foveon X3 Sensor Technology.
Coates, Colin G.; Denvir, Donal J.; Conroy, Emer; Mchale, Noel; Thornbury, Keith; Hollywood, Mark; “Back-illuminated electron multiplying technology: The world's most sensitive CCD for ultra low-light microscopy”; pp. 1-10, date unknown.
Davidson, Michael W., Abramowitz, Mortimer, et al., “Digital Imaging in Optical Microscopy” at www.micro.magnet.fsu.edu/primer/digitalimaging/digitalimagebasics.html; Bearing a date of Aug. 1, 2003; Printed on Feb. 23, 2004. pp. 1-17.
PCT Intl. Search Report, Intl App. PCT/US04/41040.
PCT International Search Report; International App. No. PCT/US04/41041.
PCT International Search Report; International App. No. PCT/US04/43025.
PCT International Search Report; International App. No. PCT/US04/41041.

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