Photo detector assembly for measuring particle sizes

Details Photo detector assembly for measuring particle sizes Photo detector assembly for measuring particle sizes

1997-03-25

1999-08-10

Pham, Hoa Q.

Optics: measuring and testing

For size of particles

By particle light scattering

356343, 250574, G01N 1502

Patent

active

059367296

ABSTRACT:
An improved photo detector assembly for a particle size distribution measuring equipment provides a unitary opaque coating deposited above a photo detector layer with a plurality of concentric apertures that can be defined with high precision about a concentric center. The masking can be applied in a production environment to ensure high accuracy and a compact size.

REFERENCES:
patent: 3310680 (1967-03-01), Hasegawa
patent: 3830569 (1974-08-01), Meric
patent: 3873206 (1975-03-01), Wilcock
patent: 4037964 (1977-07-01), Wertheimer et al.
patent: 4167335 (1979-09-01), Williams
patent: 4188121 (1980-02-01), Hirleman, Jr. et al.
patent: 4274741 (1981-06-01), Cornillault
patent: 4953978 (1990-09-01), Bott et al.

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