Optics: measuring and testing – By particle light scattering – With photocell detection
Patent
1998-01-09
1999-10-26
Kim, Robert H.
Optics: measuring and testing
By particle light scattering
With photocell detection
356345, G01B 902
Patent
active
059737824
ABSTRACT:
An improvement to wavelength modulation spectroscopy systems operating at frequency .OMEGA. and having a photodetector generating output with frequency components .OMEGA., 2.OMEGA., . . . n.OMEGA., where n is an integer greater than one, the improvement comprising a demodulator operating at frequency .OMEGA.+.delta., where .OMEGA.>>.delta., and additionally recovering signals at n.OMEGA.+n.delta.. The system provides information on multiple detection harmonics simultaneously, no phase adjustment is needed, and the system uses a heterodyne demodulation with its inherent low-noise advantage.
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Kim Robert H.
Lee Andrew H.
Myers Jeffrey D.
Southwest Sciences Incorporated
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