Phased micro analyzer V, VI

Measuring and testing – Gas analysis – By thermal property

Reexamination Certificate

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Reexamination Certificate

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07367216

ABSTRACT:
A micro fluid analyzer having a concentrator and two or more separators. The analyzer may have one, two or more pumps. The analyzer may have a hyper pre-concentrator having a number of channels. There are numerous detectors positioned along the flow path of the analyzer. Also, one or more orifices and micro valves may be positioned in the flow path. The concentrator may have an array of phased heater elements that provide a heat pulse that moves along the fluid path to provide an increasing concentration of heat. The analyzer may be configured as a multiple fluid or gas chromatograph.

REFERENCES:
patent: 3146616 (1964-09-01), Loyd
patent: 3429105 (1969-02-01), LLewellyn et al.
patent: 3557532 (1971-01-01), Broerman
patent: 3589171 (1971-06-01), Haley
patent: 3783356 (1974-01-01), Lide, III et al.
patent: 3925022 (1975-12-01), Showalter et al.
patent: 4043196 (1977-08-01), Trageser
patent: 4228815 (1980-10-01), Juffa et al.
patent: 4324566 (1982-04-01), Jacob et al.
patent: 4472355 (1984-09-01), Hickam et al.
patent: 4478076 (1984-10-01), Bohrer
patent: 4483200 (1984-11-01), Togawa et al.
patent: 4507974 (1985-04-01), Yelderman
patent: 4576050 (1986-03-01), Lambert
patent: 4735082 (1988-04-01), Kolloff
patent: 4759210 (1988-07-01), Wohltjen
patent: 4778764 (1988-10-01), Fine
patent: 4805441 (1989-02-01), Sides et al.
patent: 4909078 (1990-03-01), Sittler et al.
patent: 4944035 (1990-07-01), Aagardl et al.
patent: 5031126 (1991-07-01), McCulloch et al.
patent: 5044766 (1991-09-01), Stuart
patent: 5056047 (1991-10-01), Sondergeld
patent: 5092218 (1992-03-01), Fine et al.
patent: 5146414 (1992-09-01), McKown et al.
patent: 5168746 (1992-12-01), Madhusudhan et al.
patent: 5196039 (1993-03-01), Phillips et al.
patent: 5205154 (1993-04-01), Lee et al.
patent: 5243858 (1993-09-01), Erskine et al.
patent: 5263380 (1993-11-01), Sultan et al.
patent: 5268302 (1993-12-01), Rounbehler et al.
patent: 5268303 (1993-12-01), Bourne
patent: 5300758 (1994-04-01), Rounbehler et al.
patent: 5310681 (1994-05-01), Rounbehler et al.
patent: 5313061 (1994-05-01), Drew et al.
patent: 5379630 (1995-01-01), Lacey
patent: 5435169 (1995-07-01), Mitra
patent: 5442175 (1995-08-01), Dawson
patent: 5463899 (1995-11-01), Zemel et al.
patent: 5533412 (1996-07-01), Jerman et al.
patent: 5544276 (1996-08-01), Loux et al.
patent: 5551278 (1996-09-01), Rounbehler et al.
patent: 5552042 (1996-09-01), Le Febre et al.
patent: 5585575 (1996-12-01), Corrigan et al.
patent: 5587520 (1996-12-01), Rhodes
patent: 5808178 (1998-09-01), Rounbehler et al.
patent: 5922974 (1999-07-01), Davidson et al.
patent: 5970803 (1999-10-01), Staples et al.
patent: 6016027 (2000-01-01), DeTemple et al.
patent: 6068684 (2000-05-01), Overton
patent: 6131440 (2000-10-01), Bertrand
patent: 6139384 (2000-10-01), DeTemple et al.
patent: 6155097 (2000-12-01), Arnold
patent: 6178811 (2001-01-01), Bonne et al.
patent: 6194833 (2001-02-01), DeTemple et al.
patent: 6217829 (2001-04-01), Mustacich et al.
patent: 6308553 (2001-10-01), Bonne et al.
patent: 6311544 (2001-11-01), Bertrand
patent: 6386014 (2002-05-01), Butch
patent: 6393894 (2002-05-01), Bonne et al.
patent: 6413781 (2002-07-01), Geis et al.
patent: 6494617 (2002-12-01), Stokes et al.
patent: 6497138 (2002-12-01), Abdel-Rahman et al.
patent: 6497844 (2002-12-01), Bacaud et al.
patent: 6527835 (2003-03-01), Manginell et al.
patent: 6610977 (2003-08-01), Megerle
patent: 6649129 (2003-11-01), Neal
patent: 6666907 (2003-12-01), Manginell et al.
patent: 6732567 (2004-05-01), Briscoe et al.
patent: 6792794 (2004-09-01), Bonne et al.
patent: 6837096 (2005-01-01), Stewart
patent: 6837118 (2005-01-01), Bonne et al.
patent: 6838640 (2005-01-01), Wise et al.
patent: 6914220 (2005-07-01), Tian et al.
patent: 2004/0043479 (2004-03-01), Briscoe et al.
patent: 2004/0137637 (2004-07-01), Wang et al.
patent: 2004/0226884 (2004-11-01), O'Connor et al.
patent: 2005/0095722 (2005-05-01), McGill et al.
patent: 2005/0226778 (2005-10-01), Houser et al.
patent: 2 934 566 (1981-03-01), None
patent: 32 34 146 (1984-03-01), None
patent: 42 22 458 (1994-01-01), None
patent: 42 43 573 (1994-06-01), None
patent: 296 07 315 (1996-09-01), None
patent: 196 19 133 (1997-11-01), None
patent: 0 232 719 (1987-01-01), None
patent: 0 348 245 (1989-12-01), None
patent: 0 364 982 (1990-04-01), None
patent: 0 419 873 (1990-08-01), None
patent: 0 468 793 (1992-01-01), None
patent: 0 702 212 (1996-03-01), None
patent: 0 773 432 (1997-05-01), None
patent: 2 287 792 (1995-09-01), None
patent: 56-153256 (1981-11-01), None
patent: 57-131029 (1982-08-01), None
patent: 57-206830 (1982-12-01), None
patent: WO 92/06369 (1992-04-01), None
patent: WO 94/20825 (1994-09-01), None
patent: WO 98/22793 (1998-05-01), None
Atalla et al., “Radiation Effects with the AC Heated Strip Technique for the Measurement of Thermal Properties of Liquids”,High Temperatures—High Preassure, vol. 17, pp. 447-452, 1985.
Atalla et al.“Measurement of Thermal Properties of Liquids with an AC Heat-Wire Technique”,Interational Journal of Thermophysics, vol. 2, No. 2, 1981.
Bonne et al., “Industrial Wireless Phased Sensor Phase 1. Feasibility demonstration,”Progress report for 4th Quarter of 2002, pp. 1-17, Jan. 31, 2002.
Bonne, et al., “Phased: a faster, Smarter and More Affordable Gas Analysis Device, ”16th International Forum on Process Analytical Chemistry, San Diego, CA., Jan. 22-25, 2002, pp. 1-17.
Bonne, U., et al., “New Gas Composition and Trace Contaminant Sensors,”GTI Natural Gas Technologies Conference, Orland, FL, Sep. 30-Oct. 2, 2002, pp. 1-12.
Cabuz, C. et al., “Mesoscopic Sampler Based on 3-DF Arrays of Electrostatically Actuated Diaphragms,”Proc. 10th Conf. S.S. S & A. Transducers '99 Jun. 7-12, 1999, Sendai, Japan.
Cabuz, C., et al., “The Dual Diaphragm Pump, ” IEEE, pp. 519-522, 2001.
Dipl.-Ing. Dr. techn. Wolfgang Wehrmann et al., “Korrelationstechnik”,Expert Verlag, Grafenau, XP002094984, 173 pages, 1980.
Fuggerth, Endre, “Zone Gas Chromatography,”Analytical Chemistry, 61, No. 14, pp. 1478-1485, (1989).
Honeywell Electronic Materials Interconnect Solutions, Thin Films—Dielectrics, Comparison of Solution and Film Properties, Advanced Products for IC Fabrication, 1 page.
http://www.advanced-polymers.com/star—center/techincal—papers/reduction—in—effective—dielectric—constant.pdf, 1 page.
http://www.chrompack.com/cgi/applicsview?ap=A00607&Go=G0, NexTrieve document view, 2 pages, printed Dec. 26, 2002.
http://www.zoex.com/html/technote—kt030505-1.html, Zoex Corporation, “A New Window on the Che,” 5 pages, printed Mar. 15, 2004.
International Search Report, PCT/US00/19924, mailed Mar. 5 2001, 7 pages.
Kenndler, Ernst, “Gas Chromatography,” Institute for Analytical Chemistry, University of Vienna, pp. 1-34, Sep. 9, 1999.
Kindlund et al., “Quartz Crystal Gas Monitor With Gas Concentrating Stage,” Sensors and Actuators, 6 (1984) pp. 1-17.
NexTrieve document view, http://www.chrompack.com/cgi/applicsview?ap=A00764, 2 pages.
Park, et al., “Microdischarge Arrays: A New Family of Photonic Devices (Revised),” IEEE Journal on Selected Topics in Quantum Electronics, vol. 8, No. 2, pp. 387-394, Mar./Apr. 2002.
Park, et al., “Photodetection in the visible, ultraviolet, and near-infrared with silicon microdischarge devices,” Applied Physics Letters, vol. 81, No. 24, pp. 4529-4531, Dec. 9, 2002.
Park, et al., : Arrays of silicon micro discharge devices with multicomponent dielectrics, Optics Letters, vol. 26, No. 22, pp. 1773-1775, Nov. 15, 2001.
Phillips, J.B. et al., “Thermal Modulation: A Chemical Instrumentation Component of Potential Value in Improving Portability,” Field Analytical Chemistry and Technology, 1(1): 23-29, 1996.
Quimby, et al., “Evaluation of a Microwave Cavity, Discharge Tube, and Gas Flow System of Combined Aas Chromatography—Atomic Emission Detection,ȁ

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