Image analysis – Applications – Surface texture or roughness measuring
Reexamination Certificate
2006-01-10
2006-01-10
Patel, Kanjibhai (Department: 2625)
Image analysis
Applications
Surface texture or roughness measuring
C356S512000
Reexamination Certificate
active
06985605
ABSTRACT:
In a phase unwrapping method for fringe image analysis, when storing newly calculated numeric data into a storage list, the new numeric data is initially compared with numeric data of a representative rank within each rank block in the storage list, whereby the rank block to store the data is chosen. Subsequently, the new numeric data is compared with each of respective numeric data within thus chosen rank block, so as to determine a rank at which the new numeric data is to be stored, and then is stored into the storage list. Along with the storing of numeric data, rank data is updated.
REFERENCES:
patent: 6421629 (2002-07-01), Ishiyama
patent: 6621579 (2003-09-01), Ge
patent: 6639685 (2003-10-01), Gu et al.
patent: 6744517 (2004-06-01), Forno et al.
Extended Abstracts (The 55th Autumn Meeting, 1994); The Japan Society of Applied Physics, Sep. 1994, p. 803.
Kubo Katsuyo
Ueki Nobuaki
Fujinon Corporation
Snider Ronald R.
Snider & Associates
LandOfFree
Phase unwrapping method for fringe image analysis does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase unwrapping method for fringe image analysis, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase unwrapping method for fringe image analysis will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3597250