Phase-slipped time delay and integration scanning system

Details Phase-slipped time delay and integration scanning system Phase-slipped time delay and integration scanning system

1980-06-06

1982-04-27

Martin, John C.

Facsimile and static presentation processing

Facsimile

Specific signal processing circuitry

358113, 358206, 250578, 250334, H04N 533

Patent

active

043273777

ABSTRACT:
A scanning system wherein a linear array of N detector elements having a form spacing of X cm between their centers is oriented parallel to the line scan dimension of a raster so that each element of the array optically scans the entire field of view at a rate of V cm. per second. The detector elements are sampled every t.sub.s seconds where ##EQU1## k being an integer, and each produces, when sampled, an output signal proportional to the integrated energy exposure thereof between samplings. The output signals of the various detector elements are delayed as a function of each element's position within the array and the line scan rate. The delayed imaging signals add to provide an improved signal to noise ratio. The variability of the waveform of the composite output signal for smallsized distant targets is minimized by introducing a progressively increasing phase shift in the relative timing of the sampling signals and initial contact of the image at successive detector elements. The composite output signal of the array then corresponds to an average over all possible relative timings of sampling signals and initial contact of the image at a detector element.

REFERENCES:
patent: 3723642 (1973-03-01), Laakmann
patent: 4013832 (1977-03-01), Douglass
patent: 4222065 (1980-04-01), Pusch

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