Radiation imagery chemistry: process – composition – or product th – Radiation modifying product or process of making – Radiation mask
Patent
1997-05-27
1998-11-03
Rosasco, S.
Radiation imagery chemistry: process, composition, or product th
Radiation modifying product or process of making
Radiation mask
G03F 900
Patent
active
058306072
ABSTRACT:
A second light transmit portion of a phase shift mask is formed of a molybdenum silicide nitride oxide, or a molybdenum silicide oxide, or a chromium nitride oxide, or a chromium oxide, or a chromium carbide nitride oxide film converting a phase of transmitted exposure light by 180.degree. and having the transmittance of at least 2% and less than 5%. In the manufacturing method of the second light transmit portion, a molybdenum silicide nitride oxide film, or a molybdenum silicide oxide film, or a chromium nitride oxide film, or a chromium oxide film, or a carbide nitride oxide film is formed by a sputtering method. Consequently, with a conventional sputtering apparatus, the second light transmit portion can be formed, and additionally, etching process of the phase shifter portion is required only once, so that probabilities of defects and errors in the manufacturing process can be decreased.
REFERENCES:
patent: 4359490 (1982-11-01), Lehrer
patent: 4661426 (1987-04-01), Matsuda et al.
patent: 4678714 (1987-07-01), Watakabe
patent: 4717625 (1988-01-01), Watakabe et al.
patent: 4722878 (1988-02-01), Watakabe et al.
patent: 4738907 (1988-04-01), Shigetomi et al.
patent: 4783371 (1988-11-01), Watakabe et al.
patent: 4792461 (1988-12-01), Watakabe et al.
patent: 4873163 (1989-10-01), Watakabe et al.
patent: 4957834 (1990-09-01), Matsuda et al.
patent: 5235400 (1993-08-01), Terasawa et al.
patent: 5286581 (1994-02-01), Lee
patent: 5353116 (1994-10-01), Tanigawa et al.
Isao Akihiko
Kobayashi Ryoichi
Miyazaki Junji
Narimatsu Kouichiro
Watakabe Yaichiro
Mitsubishi Denki & Kabushiki Kaisha
Rosasco S.
Ulvac Coating Corporation
LandOfFree
Phase shift mask and manufacturing method thereof and exposure m does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase shift mask and manufacturing method thereof and exposure m, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase shift mask and manufacturing method thereof and exposure m will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-687594