Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Patent
1991-06-21
1993-01-12
Wieder, Kenneth A.
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
324622, 4552261, G01R 2700
Patent
active
051793440
ABSTRACT:
An improved circuit for phase noise measurements utilizing a frequency down conversion/multiplier and direct spectrum measurement technique which uses a combination of a phase detector method and a direct spectrum approach. The circuit is particularly useful for field test environments where laboratory instrumentation is normally not available, and fast and accurate phase noise measurements are required. The phase noise measuring circuit includes a frequency mixer which has a first input signal from a device under test and a second input signal from a reference stable oscillator having ultra low phase noise with a fixed center frequency. The frequency mixer mixes the first and second input signals to produce a down converted signal comprising the frequency difference signal of the first and second input signals. A lowpass filter then passes the down converted signal to a frequency doubler circuit which produces a doubled frequency, down converted signal. A lowpass signal filter then passes the doubled frequency, down converted signal to an amplifier. The output of the amplifier is directed to a second frequency doubler circuit which produces a quadrupled frequency, down converted signal. That signal is then directed to a further lowpass filter which passes the quadrupled frequency, down converted signal to a further amplifier. Finally, a direct approach spectrum analyzer analyzes the amplifier output signal which is an intermediate frequency signal in the most sensitive range of the spectrum analyzer for phase noise measurements on the device under test.
REFERENCES:
patent: 4634962 (1987-01-01), Banura et al.
patent: 4714873 (1987-12-01), McPherson et al.
patent: 4748399 (1988-05-01), Caldwell et al.
patent: 4864218 (1989-09-01), Leake
patent: 4918373 (1990-04-01), Newberg
Buckley Robert M.
Najle Esteban G.
Harris Corporation
Solis Jose M.
Wieder Kenneth A.
LandOfFree
Phase noise measurements utilizing a frequency down conversion/m does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase noise measurements utilizing a frequency down conversion/m, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase noise measurements utilizing a frequency down conversion/m will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-1222554