Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2006-04-25
2006-04-25
Barlow, John (Department: 2863)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
Reexamination Certificate
active
07035743
ABSTRACT:
A system and method compensate for phase noise of a spectrum analyzer when measuring the phase noise of an applied signal based on an established model of the phase noise that accommodates a variety of operating states of the spectrum analyzer. Each operating state has a carrier frequency associated therewith. A frequency offset from the carrier frequency of a designated operating state identifies a frequency range for measuring the phase noise of the applied signal. The model, along with the frequency offset, is used to form an array that is applied to extract an output signal from a phase noise measurement signal that is acquired by the spectrum analyzer.
REFERENCES:
patent: 6172564 (2001-01-01), Rzyski
patent: 6393372 (2002-05-01), Rzyski
patent: 6621277 (2003-09-01), Mar
patent: 2005/0216214 (2005-09-01), Gorin et al.
Agilent Technologie,s Inc.
Barlow John
Khuu Cindy D.
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