Optics: measuring and testing – By light interference – Having light beams of different frequencies
Reexamination Certificate
2007-12-04
2007-12-04
Lee, Hwa (Andrew) (Department: 2886)
Optics: measuring and testing
By light interference
Having light beams of different frequencies
Reexamination Certificate
active
10526443
ABSTRACT:
The invention provides a novel method for absolute fringe order identification in multi-wavelength interferometry based on optimum selection of the wavelengths to be used. A theoretical model of the process is described which allows the process reliability to be quantified. The methodology produces a wavelength selection which is optimum with respect to the minimum number of wavelengths required to achieve a target dynamic measurement range. Conversely, the maximum dynamic range is produced from a given number of optimally selected wavelengths utilized in a sensor. The new concept introduced for optimum wavelength selection is scalable, i.e. from a three wavelength system to a four wavelength system, from four wavelengths to five, etc.
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Jones Julian David Clayton
Towers Catherine Elizabeth
Towers David Peter
Heriot-Watt University
Lee Hwa (Andrew)
Young & Basile
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