Electricity: measuring and testing – Impedance – admittance or other quantities representative of... – Parameter related to the reproduction or fidelity of a...
Reexamination Certificate
2008-01-29
2008-01-29
Deb, Anjan (Department: 2858)
Electricity: measuring and testing
Impedance, admittance or other quantities representative of...
Parameter related to the reproduction or fidelity of a...
C324S076210
Reexamination Certificate
active
10557596
ABSTRACT:
When a signal having two or more frequency components is fed to a circuit to be measured, a phase of the signal output from the circuit to be measured is measured. A phase measurement device measures an output when an input signal having two input frequency components ω10and ω20is fed to an amplifier (circuit to be measured). The phase measurement device includes an orthogonal converter that subjects the output of the amplifier to an orthogonal conversion using an average frequency ω0, which is an average of ω10and ω20. A phase acquisitioner acquires phases θ1and θ2of the input frequency components in the output of the orthogonal converter and a phase θ3of a distortion component. A match time/phase measurer measures a match time Δt during which phase θ1is matched with phase θ2, and measures phase θ1(Δt) during that time. A distortion component phase measurer measures phase θ3(Δt) of the distortion component in the match time Δt. A display then displays θ1(Δt) and θ3(Δt).
REFERENCES:
patent: 2929987 (1960-03-01), Royal et al.
patent: 4071821 (1978-01-01), Harthill et al.
patent: 5025221 (1991-06-01), Blaess
patent: 5218289 (1993-06-01), Besson
patent: 5396656 (1995-03-01), Jasper et al.
patent: 5649304 (1997-07-01), Cabot
patent: 5789927 (1998-08-01), Belcher
patent: 7-229944 (1994-08-01), None
patent: 2000-314753 (2000-11-01), None
patent: 2001-251211 (2001-10-01), None
patent: 2002-228694 (2002-08-01), None
English Language Abstract of JP 2001-285211.
English Language Abstract of JP 2002-228694.
English Language Abstract of JP 2000-314753.
English Language Abstract of JP 7-229944.
Advantest Corporation
Deb Anjan
Greenblum & Bernstein P.L.C.
LandOfFree
Phase measurement device, method, program, and recording medium does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase measurement device, method, program, and recording medium, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase measurement device, method, program, and recording medium will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-3938564