Phase jitter measurement circuit

Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system

Reexamination Certificate

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Details

C702S072000, C702S074000, C702S079000, C702S089000, C702S178000, C702S189000, C327S149000, C327S158000, C327S270000

Reexamination Certificate

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11341781

ABSTRACT:
A method, an apparatus, and a system for phase jitter measurement circuits are described herein.

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