Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-12-11
2007-12-11
Tsai, Carol S. W. (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S072000, C702S074000, C702S079000, C702S089000, C702S178000, C702S189000, C327S149000, C327S158000, C327S270000
Reexamination Certificate
active
11341781
ABSTRACT:
A method, an apparatus, and a system for phase jitter measurement circuits are described herein.
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Pan Christopher
Rifani Michael C.
Wong Keng L.
Schwabe Williamson & Wyatt
Suglo Janet L
Tsai Carol S. W.
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