Phase-gain calibration of impedance/admittance meter

Details Phase-gain calibration of impedance/admittance meter Phase-gain calibration of impedance/admittance meter

2007-06-07

2010-11-16

Natalini, Jeff (Department: 2831)

Electricity: measuring and testing

Impedance, admittance or other quantities representative of...

Calibration

Reexamination Certificate

active

07834641

ABSTRACT:
A method for calibrating an impedance/admittance meter for measurements of a DUT includes measuring a pure capacitance at a desired frequency; using the capacitance measurement to establish the phase response of the meter; measuring the admittance value of a resistor with the meter at the desired frequency, the resistor having a known DC conductance and being known to primarily exhibit parallel capacitive frequency dependency; and adjusting the gain of the meter to provide the known DC conductance as the real component of the admittance value.

REFERENCES:
patent: 4782282 (1988-11-01), Bachman
patent: 6756790 (2004-06-01), Yakabe et al.
patent: 7441213 (2008-10-01), Lehner et al.
patent: 2006/0036382 (2006-02-01), Paz et al.
Efficient Microwave Bias and Testing Using the HP 4142B Modular DC Source/Monitor. Hewlett Packard. Application Note 1205 (Date: At least as early as Aug. 30, 2006.).

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