Electricity: measuring and testing – Particle precession resonance – Using a nuclear resonance spectrometer system
Reexamination Certificate
2008-01-29
2008-01-29
Arana, Louis M. (Department: 2859)
Electricity: measuring and testing
Particle precession resonance
Using a nuclear resonance spectrometer system
C324S307000
Reexamination Certificate
active
11290750
ABSTRACT:
The present invention is intended to provide a phase error measuring method capable of measuring a phase error occurring in each phase encoding direction that corresponds to the direction of a readout magnetic field gradient which is turned in units of a radian. The phase error measuring method in accordance with the present invention is implemented in a magnetic resonance imaging (MRI) apparatus that performs a K-space filling scan to define data in a K-space having readout lines formed along a Kx axis, a Ky axis, and a mixed axis of them. The phase error measuring method includes a plurality of phase error measurement steps of measuring a phase error that occurs in each phase encoding direction corresponding to the direction of a readout magnetic field gradient which is turned in units of a radian.
REFERENCES:
patent: 6472873 (2002-10-01), Yamazaki
patent: 6617850 (2003-09-01), Welch et al.
patent: 6664787 (2003-12-01), Miyoshi et al.
patent: 7030609 (2006-04-01), Pipe
patent: 2002/0047708 (2002-04-01), Miyoshi et al.
patent: 08-322817 (1996-12-01), None
patent: 10-075940 (1998-03-01), None
patent: 2002-143115 (2002-05-01), None
Arana Louis M.
Armstrong Teasdale LLP
GE Medical Systems Global Technology Company LLC
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