Electricity: measuring and testing – Particle precession resonance – Using a nuclear resonance spectrometer system
Reexamination Certificate
2008-01-29
2008-01-29
Arana, Louis M. (Department: 2859)
Electricity: measuring and testing
Particle precession resonance
Using a nuclear resonance spectrometer system
C324S307000
Reexamination Certificate
active
07323873
ABSTRACT:
The present invention is intended to provide a phase error measuring method capable of measuring a phase error occurring in each phase encoding direction that corresponds to the direction of a readout magnetic field gradient which is turned in units of a radian. The phase error measuring method in accordance with the present invention is implemented in a magnetic resonance imaging (MRI) apparatus that performs a K-space filling scan to define data in a K-space having readout lines formed along a Kx axis, a Ky axis, and a mixed axis of them. The phase error measuring method includes a plurality of phase error measurement steps of measuring a phase error that occurs in each phase encoding direction corresponding to the direction of a readout magnetic field gradient which is turned in units of a radian.
REFERENCES:
patent: 6472873 (2002-10-01), Yamazaki
patent: 6617850 (2003-09-01), Welch et al.
patent: 6664787 (2003-12-01), Miyoshi et al.
patent: 7030609 (2006-04-01), Pipe
patent: 2002/0047708 (2002-04-01), Miyoshi et al.
patent: 08-322817 (1996-12-01), None
patent: 10-075940 (1998-03-01), None
patent: 2002-143115 (2002-05-01), None
Arana Louis M.
Armstrong Teasdale LLP
GE Medical Systems Global Technology Company LLC
LandOfFree
Phase error measuring method, MR imaging method, and MRI system does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase error measuring method, MR imaging method, and MRI system, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase error measuring method, MR imaging method, and MRI system will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-2756987