Electricity: measuring and testing – Measuring – testing – or sensing electricity – per se – Phase comparison
Patent
1986-08-26
1987-11-03
Tokar, Michael J.
Electricity: measuring and testing
Measuring, testing, or sensing electricity, per se
Phase comparison
328133, G01R 2500
Patent
active
047045744
ABSTRACT:
An arrangement for coarse and vernier measuring of the delay or phase shift introduced by a delay path by generating a recurrent pseudorandom signal at an original chip clock rate derived from a reference clock. At the receiving end of the delay path, a delay locked loop regenerates the chip clock and the pseudorandom signal at a phase established by the delay. The coarse count is measured by the number of chip clock cycles. The vernier delay is measured in terms of a fractional portion of a chip clock cycle. The vernier measurement is made by starting a counter which counts reference clock signals in response to a coincidence of the original chip clock and the reference clock, and by ending counting and latching the count in response to coincidence of the regenerated chip clock and the reference clock.
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Chapter 18-8 entitled "Verneir Counting", at pp. 683-687 of the text Pulse, Digital and Switching Waveforms, by Millman and Taub, published 1965 by McGraw-Hill.
Berard Jr. Clement A.
Meise William H.
RCA Corporation
Tokar Michael J.
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