Data processing: measuring – calibrating – or testing – Measurement system in a specific environment – Electrical signal parameter measurement system
Reexamination Certificate
2007-07-31
2007-07-31
Wachsman, Hal (Department: 2857)
Data processing: measuring, calibrating, or testing
Measurement system in a specific environment
Electrical signal parameter measurement system
C702S182000, C702S189000, C331S002000, C331S025000, C329S304000, C329S311000, C375S226000, C375S260000, C375S373000
Reexamination Certificate
active
10569125
ABSTRACT:
The present invention concerns a phase Detector for detecting a phase difference between a data clock DATA-CLK and a reference clock REF-CLK using a data signal DATA. A trasnsition of the data signal DATA is synchronous with a transition of the data clock DATA-CLK. The data clock DATA-CLK and the reference clock REF-CLK have the same frequency. The phase detector includes first signal generator for generating a first binary signal ERRQ a second signal generator for generating a second binary signal ERRI. The pulse width of the second binary signal ERRI is equal to a second time difference ΔT2between a transition of the data signal DATA and a transition of the second reference clock signal CKI adjacent to the transition of the data signal DATA.
REFERENCES:
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Renaud et al., ‘A CMOS Three-State Frequency Detector Complementary to An Enhanced Linear Phase Detector for PLL, DLL or High Frequency Clock Skew Measurement’, 2003, IEEE Publication, pp. 148-151.
Wantanabe et al., ‘An All-Digital PLL for Frequency Multiplication by 4 to 1022 with Seven-Cycle Lock Time’, Feb. 2003, IEEE Publication, vol. 38, No. 2, pp. 198-204.
Sanduleanu Mihai Adrian Tiberiu
Stikvoort Eduard Ferdinand
Desta Elias
Wachsman Hal
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