X-ray or gamma ray systems or devices – Specific application – Holography or interferometry
Patent
1997-03-28
1999-03-09
Porta, David P.
X-ray or gamma ray systems or devices
Specific application
Holography or interferometry
378145, G01N 2306
Patent
active
058811265
ABSTRACT:
A phase-contrast X-ray imaging system according to the present invention comprises an X-ray interferometer, wherein X-ray interfering beams thicker than 2 cm.times.2 cm are formed enabling observation of comparatively large objects. The X-ray interferometer is constituted by two crystal blocks which each are monolithically cut out from ingots of crystal and have two wafers which function as X-ray half mirrors. Optical equipment, a chamber, and a feedback system are incorporated to adjust and stabilize the crystal blocks. A device is also incorporated to obtain an image showing the distribution of the X-ray phase shift with which diagnosis become easier and reliable.
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"Phase-Constrast Radiographs of Nonstained Rat Cerebellar Specimen", by Atsushi Momose, Med. Phys. 22 pp. 375-379 (1995) no month.
"Phase-Contrast X-Ray Computed Tomography for Observing Biological Specimens and Organic Materials", by Atsushi Momose, Rev. Sci. Instrum. 66 pp. 1434-1436. (1995) no month.
Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses, by J.H. Bruning, et al. Applied Optics. pp. 2693-2703 (1974) no month.
"The Skew-Symmetric Two-Crystal X-Ray Interferometer" by P. Becker, et al. J. Appl. Cryst. 7, 593 (1974). no month.
Hitachi , Ltd.
Porta David P.
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