Phase-contrast x-ray imaging system

X-ray or gamma ray systems or devices – Specific application – Holography or interferometry

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378 37, G03H 500

Patent

active

059303255

ABSTRACT:
A phase-contrast X-ray imaging system according to the present invention comprises an X-ray interferometer, wherein X-ray interfering beams thicker than 2 cm.times.2 cm are formed enabling observation of comparatively large objects. The X-ray interferometer is constituted by two crystal blocks which each are monolithically cut out from ingots of crystal and have two wafers which function as X-ray half mirrors. An optical equipment, a chamber, and a feedback system are incorporated to adjust and stabilize the crystal blocks. A device is also incorporated to obtain an image showing the distribution of the X-ray phase shift with which diagnosis become easier and reliable.

REFERENCES:
patent: 3393314 (1968-07-01), Spielberg
patent: 3407296 (1968-10-01), Armstrong
patent: 3439164 (1969-04-01), Spielberg et al.
patent: 3446961 (1969-05-01), Bonse et al.
patent: 4174478 (1979-11-01), Franks
"Phase-Contrast Radiographs of Nonstained Rat Cerebellar Specimen", by A. Momose, Med. Phys. 22, pp. 375-379 (1995).
"Phase-Contrast X-Ray Computed Tomography for Observing Biological Specimens and Organic Materials", by A. Momose, Rev. Sci. Instrum. 66, pp. 1434-1436.
"Digital Wavefront Measuring Interferometer for Testing Optical Surfaces and Lenses", by J. H. Bruning et al, Applied Optics, pp. 2693-2703 (1974).
"The Skew-Symmetric Two-Crystal X-Ray Interferometer", by P. Becker et al, J. Appl. Cryst. 7, 593 (1974).

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