Phase contrast aberroscope

Details Phase contrast aberroscope Phase contrast aberroscope

1999-06-18

1999-12-14

Kim, Robert H.

Optics: measuring and testing

By dispersed light spectroscopy

Utilizing a spectrometer

356359, G01B 902

Patent

active

060024844

ABSTRACT:
A wavefront aberration measuring device and method is based on the principles of phase contrast interference. A particular application is the two-dimensional representation of the complex optical aberrations of the complete eye optics. This device consists of an illuminating optical part, to project an image of an annular light source on the retina of the eye. This projected image becomes a secondary light source on the retina that transilluminates in reverse the eye optics. Because of imperfections in the eye optics, some phase distortions will be added to the reflected light. In the analyzing part of the device, this reflected light is optically transformed with the help of a phase plate. The resulting interference pattern is visualized with the observational part of the device and further digitally processed in order to display the optical aberrations without the need for an extensive polynomial analysis. An optional fixation device can be added to control the direction of gaze of the eye. Additionally, the instrument can be mounted on a conventional slitlamp or operating microscope.

REFERENCES:
patent: 5638176 (1997-06-01), Hobbs et al.

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