Phase conjugate interferometer for measuring thin film propertie

Details Phase conjugate interferometer for measuring thin film propertie Phase conjugate interferometer for measuring thin film propertie

1989-11-13

1990-12-25

Turner, Samuel

Optics: measuring and testing

By polarized light examination

With birefringent element

G01B 902

Patent

active

049798286

ABSTRACT:
An interferometric device for measuring optical thin film parameters such as refractive index, thickness and absorption uses phase conjugate mirrors in place of standard mirrors. The optical thin film for which the refractive index, thickness and absorption are determined acts as a beam-splitter in the interferometer.

REFERENCES:
patent: 4280764 (1981-07-01), Sica, Jr. et al.
patent: 4529273 (1985-07-01), Cronin-Golomb et al.
patent: 4718749 (1988-01-01), Chiou et al.
patent: 4773719 (1988-09-01), Anderson et al.
patent: 4832463 (1989-05-01), Goldner et al.
"Optical parameters of partially transmitting thin films", by J. Shamir & P. Graff, Applied Optics, vol. 14, No. 12, Dec. 1975.

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