Optics: measuring and testing – Material strain analysis – By light interference detector
Patent
1980-02-21
1981-07-28
Punter, William H.
Optics: measuring and testing
Material strain analysis
By light interference detector
356345, 356360, G01L 124, G01B 902, G01B 1116
Patent
active
042807646
ABSTRACT:
A speckle interferometer including a beam splitter, a mirror in the object beam arm, a phase-conjugate mirror in the reference beam arm, a converging lens and a photographic film. Laser light scattered retro-reflectively from a rough surface under investigation and passed through an imaging lens illuminates the interferometer. Fringes occur upon sandwiching a pair of exposures of the interference pattern made before and after deformation of the rough surface. The relative magnitude of the displacements from the original position at different points of the surface can be determined from the position of the fringes.
REFERENCES:
patent: 2688899 (1954-09-01), Rantsch
patent: 4046477 (1977-09-01), Kaule
patent: 4180324 (1979-12-01), Primbsch
Steel, W. H., "Interferometry", Cambridge at the Univer. Press, 1967, pp. -63.
Sica, Jr. Louis
Szu Hwaling H.
Ellis William T.
Klein Alan P.
Punter William H.
Sciascia R. S.
The United States of America as represented by the Secretary of
LandOfFree
Phase-conjugate interferometer does not yet have a rating. At this time, there are no reviews or comments for this patent.
If you have personal experience with Phase-conjugate interferometer, we encourage you to share that experience with our LandOfFree.com community. Your opinion is very important and Phase-conjugate interferometer will most certainly appreciate the feedback.
Profile ID: LFUS-PAI-O-547381