Phase changeable memory devices including nitrogen and/or...

Active solid-state devices (e.g. – transistors – solid-state diode – Field effect device – Charge transfer device

Reexamination Certificate

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Details

C257S002000, C257S003000, C257S004000, C257S202000, C257S248000, C257S257000, C257S296000, C257S298000, C257S758000

Reexamination Certificate

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10910945

ABSTRACT:
Phase-changeable memory devices and method of fabricating phase-changeable memory devices are provided that include a phase-changeable material pattern of a phase-changeable material that may include nitrogen atoms and/or silicon atoms. First and second electrodes are electrically connected to the phase-changeable material pattern and provide an electrical signal thereto. The phase-changeable material pattern may have a polycrystalline structure.

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