Active solid-state devices (e.g. – transistors – solid-state diode – Bulk effect device – Bulk effect switching in amorphous material
Reexamination Certificate
2011-04-19
2011-04-19
Nguyen, Dao H (Department: 2818)
Active solid-state devices (e.g., transistors, solid-state diode
Bulk effect device
Bulk effect switching in amorphous material
C257S002000, C257S004000, C257S005000, C257SE31015, C257SE31029, C257SE45002, C257SE47005, C438S095000, C438S097000, C438S253000, C438S396000, C438S597000
Reexamination Certificate
active
07928420
ABSTRACT:
A storage cell, integrated circuit (IC) chip with one or more storage cells that may be in an array of the storage cells and a method of forming the storage cell and IC. Each storage cell includes a stylus, the tip of which is phase change material. The phase change tip may be sandwiched between an electrode and conductive material, e.g., titanium nitride (TiN), tantalum nitride (TaN) or n-type semiconductor. The phase change layer may be a chalcogenide and in particular a germanium (Ge), antimony (Sb), tellurium (Te) (GST) layer.
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Horak David V.
Lam Chung H.
Wong Hon-Sum P.
Alexanian Vazken
Cheung, Esq. Wan Yee
International Business Machines - Corporation
Law Office of Charles W. Peterson, Jr.
Nguyen Dao H
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